AFM Probes

CSInstruments, new distributor of AppNano AFM Probes

AppNano develops, manufactures, and supplies various nanostructures including both conventional and specialized SPM probes for most applications. We leverage our extensive experience in nanofabrication technology and research in AFM probes to supply the highest quality probes utilizing the latest technology in the market.
Many models are available. Standard Contact / Tapping Mode probe, Standard Electric Force mode probe, Force Modulation Standard probe mode, Standard Mode Non-Contact/Tapping probes.
For more information you can contact us at : afm.probes@csinstruments.eu
Probes guideRequest for Quote Other electrical AFM Probes

High Quality Budget Probes €15/probes

high quality budget AFM probes

Probe Model Spring constant ( N/m) Resonance frequency (kHz) Length (μm) Width (μm) Thickness (μm) Reflex side coating Tip side coating Tip height (μm) Tip radius of curvature (nm) Prices for set of 50 probes
Tapping / Non-Contact Mode Probes  TM300 40 300 125 30 4 Uncoated Uncoated 14-16 <10 € 660
TM300A 40 300 125 30 4 Al Uncoated 14-16 <10 € 660
TM300G 40 300 125 30 4 Au Uncoated 14-16 <10 € 704
     
Long Tapping / Non-Contact Mode Probes  TM190 45 190 225 40 7,8 Uncoated Uncoated 14-16 <10 € 660
TM190A 45 190 225 40 7,8 Al Uncoated 14-16 <10 € 660
TM190G 45 190 225 40 7,8 Au Uncoated 14-16 <10 € 704
     
Force Modulaton Mode Probes  FM60 3 60 225 27 2,7 Uncoated Uncoated 14-16 <10 € 660
FM60A 3 60 225 27 2,7 Al Uncoated 14-16 <10 € 660
FM60G 3 60 225 27 2,7 Au Uncoated 14-16 <10 € 704
     
Short Contact Mode Probes  CM28 0,1 28 225 46 1 Uncoated Uncoated 14-16 <10 € 660
CM28A 0,1 28 225 46 1 Al Uncoated 14-16 <10 € 660
CM28G 0,1 28 225 46 1 Au Uncoated 14-16 <10 € 704
     
Contact Mode Probes  CM12 0,2 12 450 49 2,5 Uncoated Uncoated 14-16 <10 € 660
CM12A 0,2 12 450 49 2,5 Al Uncoated 14-16 <10 € 660
CM12G 0,2 12 450 49 2,5 Au Uncoated 14-16 <10 € 704

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Non-contact/ Oscillating mode Probes

FORT probes are medium frequency silicon probes designed for tapping / non-contact mode applications. These probes have a medium spring constant that make them ideally suited for Force Modulation Microscopy.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
FORT
R, G, A, SS*
1,6
61
6nm (<10nm)

 

ACT probes are silicon probes designed for tapping / non-contact mode applications. These probes feature a short cantilever.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACT
R, G, A, SS*
37
300
6nm (<10nm)

 

ACL silicon probes are designed for tapping / non-contact mode applications. These probes feature a long, thin cantilever that allows for greater laser clearance than our standard ACT model.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACL
R, G, A, SS*
58
190
6nm (<10nm)

 

ACST probes are silicon probes designed for non-contact or soft tapping mode applications. These probes are reasonably soft with a mid-range resonance frequency. ACST-SS probes have a super sharp tip, and ACST-TL are tipless.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACST
R, G, A, SS*
7,8
150
6nm (<10nm)

 

ACCESS probes are used in contact and non-contact and allow a direct optical view. They compensate the deflection angle for dimensional measurements. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging…

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACCESS-NC
78
300
<10nm
ACCESS-FM
2.7
60
<10nm

 

* Reflex Coating : A for Aluminium * Shape : V – for V shape ; R – for Rectangular * Reflex Coating : G fo Gold ; A for Aluminium * Tip & Reflex Coating : PtIr for Platine Iridium . Cr-Co for Chrome Cobalt *Aspect : SS for SurperSharpsharp

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Contact mode Probes

HYDRA-ALL Series probes are designed primarily for imaging soft samples in contact or for force-distance applications, but can also be used for imaging samples in non-contact / tapping mode in liquid. Hydra-All probes have 4 V-shaped cantilevers on one chip with differents spring constant….

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
Hydra-All
G*
0,292, 0.045, 0.405, 0,081
66,17,67
<10nm

 

SHOCON probes are designed for contact mode applications with a shorter lenght, providing better sensitivity without compromising on spring constant requirements.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
SHOCON
A, G, GG, SS, TL*
0.14, 0.01, 0.60
21, 8, 37
6nm, 30nm, 1-2nm

 

SICON probes are for contact mode applications. These probes have a long, thin cantilever allowing for a low spring constant and improved laser clearance.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
SICON
A, G, GG, SS, TL*
0.29, 0.13, 0.6
15, 11, 19
6nm, 30nm, 1-2nm

 

ACCESS probes are used in contact and non-contact and allow a direct optical view. They compensate the deflection angle for dimensional measurements. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging…

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ACCESS-C
A*
0,3
16
<10nm

 

* Reflex Coating : G fo Gold ; A for Aluminium *Aspect : SS for SurperSharpsharp

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EFM/ KFM mode probes

ANSCM probes are silicon probes with a thin layer of Pt/Ir coating on both reflex and tip sides of the probes. These probes are ideal for Electrical Force Microscopy (EFM) and Kelvin Force Microscopy (KFM) applications, and are available for use in CAFM mode.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ANSCM
PtIr*
37, 2.7
300, 60
30nm

 

Conductive ACCESS probes are silicon probes with conductive coating designed to allow a direct optical view of AFM tip when imaging.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
Conductive ACCESS
PtIr, G*
2.7
60
<10 nm

 

* Tip & Reflex Coating : PtIr for Platine Iridium, * Reflex Coating : G fo Gold

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CAFM/ ResiScope mode Probes

Doped Diamond Probes offer a unique combination of hardness and conducting tip. They are specially designed for electrical measurements based on contact mode. The tip side of these probes is coated with polycrystalline diamond. The diamond film is in-situ doped with boron to make it highly conducting. The reflex side of the cantilever is coated with Aluminum. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness. …

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
Doped Diamond
A*
37, 1.6, 0.29
300, 61, 15
100-300nm

 

 

Conductive ACCESS probes are silicon probes with conductive coating designed to allow a direct optical view of AFM tip when imaging.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
Conductive ACCESS
PtIr, G*
2.7
60
<10 nm

 

 

ANSCM probes are silicon probes with a thin layer of Pt/Ir coating on both reflex and tip sides of the probes. These probes are ideal for Electrical Force Microscopy (EFM) and Kelvin Force Microscopy (KFM) applications, and are available for use in CAFM mode.

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
ANSCM
PtIr*
37, 2.7, 0.29
300, 60, 12
30nm

 

* Reflex Coating : A for Aluminium, * Tip & Reflex Coating : PtIr for Platine Iridium, * Reflex Coating : G fo Gold

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MFM mode Probes

MAGT probes are silicon probes specially designed for Magnetic Force Microscopy (MFM) applications. Both reflex and tip sides have a layer of magnetic coating. Our MAGT probes vary in coercitivity and moment to match different MFM requirements….

Probes models
Description
Constant (N/m)
Frequency (khz)
Tip ROC
MAGT
Cr-Co*
2,7
61
40nm
MAGT-LM
Cr-Co*
2,7
61
25nm
MAGT-HM
Cr-Co*
2,7
61
75nm

 

* Tip & Reflex Coating : PtIr for Platine Iridium . Cr-Co for Chrome Cobalt

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Other AFM Probes