CSI AFM Probes

The best AFM Probes for your AFM Measurements
Resolution, Lifetime, Conductivity

 

Why choose CSI AFM probes ?

CSI AFM Probes

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  • Compatible with All Models of AFM
  • High Performance
  • Strength and Resolution
  • Sharp Single Crystal Diamond Probes at Affordable Prices

CSI AFM Probes

Others

CSI AFM Probes AFM Probes
CSI AFM Probes AFM Probes
Back Surface Field (BSF) sample.
ResiScope measurement with Sharp Crystal Diamond (CS-A-E40) 40N/m
Back Surface Field (BSF) sample.
ResiScope measurement with standard doped diamond probes (40N/m)
==> Even if CSI single crystal diamond probe use a high spring constant, the tip is not damaged, the conductivity is enhanced and the lateral resolution is improved !

 

 

Probes types

Electrical/ Topography - Sharp conductive diamond probes

CSI AFM ProbesAFM Modes:

  • Contact Mode/ Resonant Mode
  • Force Modulation
  • C-AFM
  • ResiScope
  • PFM
  • EFM
  • HD-KFM, etc.

Highly conductive diamond probes, formed by a unique patented process ensure the best possible wear and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. Our Super-Sharp probes have demonstrated atomic resolution in air and vacuum environments.

 

 Reference Max Tip Radius nm Cantilever Length Cantilever Width Cantilever Thickness Resonance Frequency kHz Spring Constant N/m
-S -SS ± 10 µm ± 5 µm ± 5 µm  Min Nom  Max  Min Nom Max
 CS-A-E0.5 10 5 225 48 1.0 20 30 40 0.2 0.5 0.9
 CS-A-E2.8 10 5 225 35 1.5 50 65 100 1.2 2.8 4.5
 CS-A-E40 10 5 225 28 3.0 140 180 220 20 40 60
 Quantities …………..  …………….
 5 $1.000 $1.500
 10 $1.900 $2.850
 20 $3.500 /
50 $8.400 /

More Information Request for quote

 

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