CSI AFM Probes

The best AFM Probes for your AFM Measurements
Resolution, Lifetime, Conductivity

 

Why choose CSI AFM probes ?

CSI AFM Probes

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  • Compatible with All Models of AFM
  • High Performance
  • Strength and Resolution
  • Sharp Single Crystal Diamond Probes at Affordable Prices

CSI AFM Probes

Others

CSI AFM Probes AFM Probes
CSI AFM Probes AFM Probes
Back Surface Field (BSF) sample.
ResiScope measurement with Sharp Crystal Diamond (CS-A-E40) 40N/m
Back Surface Field (BSF) sample.
ResiScope measurement with standard doped diamond probes (40N/m)
==> Even if CSI single crystal diamond probe use a high spring constant, the tip is not damaged, the conductivity is enhanced and the lateral resolution is improved !

 

 

Probes types

Electrical/ Topography - Sharp conductive diamond probes

CSI AFM ProbesAFM Modes:

  • Contact Mode/ Resonant Mode
  • Force Modulation
  • C-AFM
  • ResiScope
  • PFM
  • EFM
  • HD-KFM, etc.

Highly conductive diamond probes, formed by a unique patented process ensure the best possible wear and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. Our Super-Sharp probes have demonstrated atomic resolution in air and vacuum environments.

 

 References Max Tip Radius nm Cantilever Length Cantilever Width Cantilever Thickness Resonance Frequency kHz Spring Constant N/m
-S ± 10 µm ± 5 µm ± 5 µm  Min Nom  Max  Min Nom Max
 CS-A-E0.5 10 225 48 1.0 20 30 40 0.2 0.5 0.9
 CS-A-E2.8 10 225 35 1.5 50 65 100 1.2 2.8 4.5
 CS-A-E40 10 225 28 3.0 140 180 220 20 40 60
 Quantities
 5 $1.000
 10 $1.900
 20 $3.500
50 $8.400

 

Bulk Tip

Diamond Tip

Tip Shape 4 Sided Pyramid Tip Shape Cone
Height 12.5 ± 2.5 um Radius 10 ± 5 nm (AS) / < 5 nm (SS)
Front Angle (FA) 25 ± 5 degrees Height 300 ± 100 nm
Back Angle (SA) 15 ± 5 degrees Tilt Angle 0 ± 1 degrees
Side Angle (SA) 22.5 ± 5 degrees Material Single Crystal Diamond
Tip Setback (TSB) 15 ± 5 um ½ Angle 15 ± 2 degrees

 

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Cone Probes, imaging and electrical modes

The FM-LC and NCH-LC probes are a new cone shaped tip what offers you the advantages of diamond at higher resolution and without the variability in tip shape associated with competing diamond coated products. These probes are ideally suited to long lifetime imaging of low relief samples. They are also conductive with a contact resistance in the 100 kOhm range

AFM Modes:
  • Contact Mode
  • Resonant Mode
  • Amplitude Modulation
  • Frequency Modulation
  • LFM
  • C-AFM
  • PFM
  • EFM
  • KFM & HD-KFM™
  • ResiScope™ & Soft-ResiScope™

 

 Reference Length Width Thickness Frequency
(kHz)
Spring Constant
(N/m)
Tip Radius (nm)
± 10 µm ± 5 µm ± 0.5 µm  Min Nom  Max  Min Nom Max
CS-FM-LC 225 48 3.5 50 100 150 4 8 16 20 ± 10
CS-NC-LC 125 32 4.5 300 450 600 50 100 200 20 ± 10
 Quantities
5 $700
10 $1.350
20 $2.450
50 $5.900

 

Bulk Tip

Diamond Tip

Tip Shape 4 Sided Pyramid Tip Shape Cone
Height 12.5 ± 2.5 um Radius 20 ± 10 nm
Front Angle (FA) 25 ± 5 degrees Height 175 ± 50 nm
Back Angle (SA) 15 ± 5 degrees Tilt Angle 0 ± 1 degrees
Side Angle (SA) 22.5 ± 5 degrees Material Single Crystal Diamond
Tip Setback (TSB) 15 ± 5 um ½ Angle 45 ± 3 deg (RC) / 45 ± 10 deg (TC)

 

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Other AFM probes ………………………………….