AFM Modes

In addition to performance, the Nano-Observer is capable of several advanced modes wich expand your field of investigation. Beside contact/ LFM and Oscillating/Phase imaging, several modes are available to characterize mechanical viscoelasticity, adhesion of your samples as well as electrical properties (ResiScope, Soft ResiScope, CAFM), electric and magnetic fields (MFM/EFM) and surface potential (HD KFM ) .

 

contact modeContact Mode

A tip of nanometric size scans the surface using piezoelectric motors. Laser detection maintains a constant bending of the…

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Oscillating modeOscillating Mode

A tip vibrating at its resonant frequency sweeps the surface using piezoelectric motors. Laser detection maintains the…

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Force Modulation Force Modulation Mode

Force modulation mode is a mode of contact AFM. A mechanical oscillation is applied to the tip…

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Conductive AFMConductive AFM Mode

CAFM is a AFM contact mode.  A conductive tip saves the current variations of the surface using an amplifier.

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MFM modeMFM Mode

MFM is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample…

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EFM modeEFM Mode

EFM is an oscillating mode. A conductive tip scans the surface to record the topography. Then, the tip is over the sample and recordi…

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KFM modeHD-KFM TM Mode

Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of AFM microscopy…

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ResiScope modeResiScope Mode

Resiscope mode is a mode of contact AFM. A conductive tip saves changes in current and resistance on a wide range with an external…

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Soft ResiScope ModeSoft ResiScope Mode

The Soft ResiScope principle is based on intermittent contact. The lack of friction and the constant force of the tip on the sample provide …

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PFM modePFM Mode

PFM is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas …

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Thermal analysisThermal Measurements

The probe mounted on a dedicated support  is moved to the point selected and placed on the surface of the sample………………………

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Atmosphere controlEnvironmental Control

Prevents the contamination, stable measurements for electrical characterization, ResiScope, CAFM, KFM. Electrical…

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temperature controlEZ Temp

Ambiant to 180°C, compatible with Oscillating and contact modes, applications : polymers, biology…

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liquid measurementEZ Liquids

Oscillating and contact mode, applications : biology, material science…

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