MFM

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Magnetic Force Microscopy Applications

MFM is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.

Applications

 Semiconductor
 Data storage
 Material science

E1 MFM 30 MIC 2 retravaillÇe

Related products

AFM microscope Nano Observer
electrical-measurement-AFM

ResiScope II,
AFM Electrical Characterization

AFM probes

AFM Probes Shop,
Wide range of SPM probes.

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