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HD-KFM Applications

Kelvin Force Microscopy (KFM) allows to measure the surface potential (SP) between an oscillating conductive tip and the surface. SP measurement can be used to determine intrinsic properties like work function or bandgap. CSInstruments has developed an ultra-sensitive implementation of KFM named as High Definition-KFM (HD-KFM), which uses 2 lock-ins matched to the first two eigenmode frequencies of the cantilever to acquire both topography and SP. This setup combines the benefits of the single-pass approach with the enhancement of the electrical signal due to the mechanical resonance matching.


 Materials science
 Life science

MoS2 flakes on Si, HD-KFM, 30µm
MoS2 flakes on Si, HD-KFM, 30µm

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