AFM Electrical characterization

ResiScope II: AFM Electrical characterization

“The World’s Greatest Performance for AFM Electrical Characterization.”

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ResiScope Mode – VO2 sample – 10 µm – Topography and Current signals

What’s ResiScope ?

The ResiScope II is a unique system able to measure AFM resistance over 10 decades with a high sensitivity and resolution. It can be combined with several dynamic modes as MFM/EFM (AC/MAC mode) or KFM single‐pass (AC/MAC III) providing several sample characterization on the same scan area.

A dual measurement system :

 Resistance measurement
 Current measurement (& IV spectroscopy)
 Compatible with Oscillating mode (Tapping / AC mode )
 Compatible with EFM/MFM or Single-pass KFM
 Resistance 102 ohms to 1012 ohms (10 decades dynamic)
 Output information : R, Log R, Current & I/V Spectroscopy

Intuitive software

 Easy to use
 Automatic mode selection
 Configurable outputs
 Selectable output scale : R | Log R | Current

Carbon black stripe , ResiScope mode, 60µm
Stainless steel, ResiScope mode, 50µm
Organic Solar Cell layer, ResiScope mode, 5µm
SBS, ResiScope mode, 3µm

Applications :

Photovoltaic           Oxyde characterization
Semiconductors    All conductive characterization

Principle :

During the measurement, the DSP chooses in real time the best gain to optimize the measurement made by the amplifier module (HPA). This operating condition allows a very high sensitivity on all the range of resistivity at a regular scan speed (AFM) . Contrary to other techniques, the current between the probe and the sample is strongly reduced. This has the result of limiting the local effect of oxidation or electrochemistry and protecting the conductive probe from high current damage.

ResiScope is a smart real-time control of the appropriate ranges to obtain the best measurement (sensitivity and range). It limits the current through tip and sample is limited to prevent any damage. It is more than a simple linear or Log amplifier used for a basic current measurement

Related products

Soft ResiScope,
ResiScope on soft sample

AFM microscope Nano Observer

Discover ResiScope,
Chapter XII