Force modulation mode is compatible with all AFM contact mode probes. Results depends of mechanical properties of the sample surface.
Force modulation is an AFM mode where probe properties of materials are understood through tip and sample interactions. The tip is oscillated at a high frequency and pushed into the repulsive regime where the force-distance curve can be measured and correlated to sample elasticity. The modulation data can be acquired in tandem with topography, allowing for comparison of both height and material properties.