EZ Temperature

Temperature Control

EZ TEMPerature : AFM Temperature control

Real time acquisition, polymer crystallization under temperature control, 10 μm

The Nano-Observer AFM is compatible with the temperature control accessory EZ temperature and peltier developed by CSI to deliver precise temperature control and imaging during temperature changes. It is compatible with all AFM modes. A heating or cooling sample stage is available to study temperature-dependent surface phenomena like phase transitions on polymers, materials or biological samples. Temperature range is from -40°C to 300°C. The design of the Nano-Observer architecture minimizes the temperature gradient between the heating/cooling stage and the scanner, so that thermal drift is minimized. This allows to perform stable imaging during temperature rise.

Applications

 Polymers  Biology  Materials  Electrical measurements…

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