EZ TEMPerature : AFM Temperature control
Real time acquisition, polymer crystallization under temperature control, 10 μm
The Nano-Observer AFM is compatible with the temperature control accessory EZ temperature and peltier developed by CSI to deliver precise temperature control and imaging during temperature changes. It is compatible with all AFM modes. A heating or cooling sample stage is available to study temperature-dependent surface phenomena like phase transitions on polymers, materials or biological samples. Temperature range is from -40°C to 300°C. The design of the Nano-Observer architecture minimizes the temperature gradient between the heating/cooling stage and the scanner, so that thermal drift is minimized. This allows to perform stable imaging during temperature rise.
Polymers Biology Materials Electrical measurements…
Precise temperature & imaging during temperature changes
The design of the Nano-Observer AFM is made in anticipation of future developments and may receive additional modules for more advanced studies on the same sample. The temperature control is developped to deliver precise temperature and imaging during temperature changes.
It is compatible with fully AFM modes. A heating sample stage is available to study phase changes on polymers, materials or biological samples.
Limited thermal expansion
Working in low temperature
-40°C to 300°C
Imaging during temperature change
Compatible with : Oscillating/contact modes, Environmental control, Liquids
Stability and reproducibility
EZ Temperature AFM probes
|Temperature||-40°C to 300°C|
|Height sample max||4mm
|all AFM modes|