EZ Temperature

Temperature Control

Overview

EZ TEMPerature : AFM Temperature control

The Nano-Observer AFM is compatible with the temperature control accessory EZ temperature and peltier developed by CSI to deliver precise temperature control and imaging during temperature changes. It is compatible with all AFM modes. A heating or cooling sample stage is available to study temperature-dependent surface phenomena like phase transitions on polymers, materials or biological samples. Temperature range is from -35°C to 250°C. The design of the Nano-Observer architecture minimizes the temperature gradient between the heating/cooling stage and the scanner, so that thermal drift is minimized. This allows to perform stable imaging during temperature rise.

Real time acquisition, polymer crystallization under temperature control, 10 μm

Applications

 Polymers  Biology  Materials  Electrical measurements…

Interest

Precise temperature & imaging during temperature changes

The design of the Nano-Observer AFM is made in anticipation of future developments and may receive additional modules for more advanced studies on the same sample. The temperature control is developped to deliver precise temperature and imaging during temperature changes.

It is compatible with fully AFM modes. A heating sample stage is available to study phase changes on polymers, materials or biological samples.

Benefits

 Limited thermal expansion
 Working in low temperature
 Thermal insulation
-35°C to 250°C
 Precise temperature
 Imaging during temperature change
 Compatible with : Oscillating/contact modes, Environmental control, Liquids
 Stability and reproducibility

Specifications
Temperature-35°C to 250°C
Active zone Ø25mm
Height sample max 4mm
Temperature
precision
0.1°C
Compatible
with
all AFM modes

More information ?

Other AFM environments

EZ liquids

Measurements in liquid

Environmental control

Gas, humidity

EZ Temperature AFM probes

EZ Temperature AFM probes

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