Overview

Contact mode

A probe of nanometric size scans the surface using piezoelectric motors. Laser detection maintains a constant bending of the cantilever during the measurement. The movements of the vertical piezoelectric motor are recorded vertical to reconstruct the surface. Mapping of friction is performed with the torsion of the cantilever (LFM).

Applications

 Materials science
 Electronic materials
 Life science
 Nanostructure
 Polymer

Interest

Deflection & friction signals

AFM contact mode allows rapid measurements on any sample type. The signals issue from the horizontal photo detectors contributes to the study of friction between the tip and the sample. The forces applied to the surface depend on the constant stiffness constant of the cantilever. These forces also vary as a function of the setpoint value which allows the study of friction as a function of the force applied. The force curves will help the study of local mechanical properties such as adhesion and stiffness.

Benefits

 High resolution
 Force curve
 Deflection & friction signals

Transistor, ResiScope mode, 1.5µm
Stainless steel, resiscope mode, 1µm
SBS, ResiScope mode, 3µm
sRAM, ResiScope mode, 50µm
Organic Solar Cell layer, ResiScope mode, 5µm
Local Oxidation Nanolithography, ResiScope mode, 5µm
Stainless steel, ResiScope mode, 50µm
OPV, ResiScope mode, 10µm
sRAM, ResiScope mode, 50µm
PZT, PFM mode, 10µm
ZnO, PFM mode, 1µm
Carbon Fibers in epoxy, Force modulation mode, 30µm
Associated modes

Conductive AFM

ResiScope

Force Modulation

PFM
mode

Other AFM modes

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AFM microscope Nano Observer

ResiScope II,
AFM Electrical Characterization

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Wide range of SPM probes

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