A medium resonant frequency probe is necessary for soft resiscope mode. Metal coating and diamond probes can be use depending on sample material.
Soft ResiScope mode is an intermittent mode. The AFM probe only stays in contact with the sample during a short period of time with a constant force control which allows the ResiScope II to measure the resistance and the current in the best conditions for quantitative measurements. Then the tip is retracted and moves to the next step