AFM Modes

Multiple AFM Modes

In addition to performance, the Nano-Observer is capable of several advanced modes wich expand your field of investigation. Beside contact/ LFM and Oscillating/Phase imaging, several modes are available to characterize mechanical viscoelasticity, adhesion of your samples as well as electrical properties (ResiScope, Soft ResiScope, CAFM), electric and magnetic fields (MFM/EFM) and surface potential (HD KFM ) .

Contact Mode

A tip of nanometric size scans the surface using piezoelectric motors. Laser detection maintains a constant bending of the…

Oscillating Mode

A tip vibrating at its resonant frequency sweeps the surface using piezoelectric motors. Laser detection maintains the…

Force Modulation Mode

Force modulation mode is a mode of contact AFM. A mechanical oscillation is applied to the tip…

Conductive AFM Mode

CAFM is a AFM contact mode.  A conductive tip saves the current variations of the surface using an amplifier.

MFM Mode

MFM is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample…

EFM Mode

EFM is an oscillating mode. A conductive tip scans the surface to record the topography. Then, the tip is over the sample and recordi…

HD-KFM Mode

Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of AFM microscopy…

ResiScope Mode

Resiscope mode is a mode of contact AFM. A conductive tip saves changes in current and resistance on a wide range with an external…

Soft ResiScope Mode

The Soft ResiScope principle is based on intermittent contact. The lack of friction and the constant force of the tip on the sample provide …

PFM Mode

PFM is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation…

Thermal Measurements

The probe mounted on a dedicated support  is moved to the point selected and placed on the surface of the sample…

Environmental Control

Prevents the contamination, stable measurements for electrical characterization, ResiScope, CAFM, KFM. Electrical…

EZ Temp

-35°C to 250°C, compatible with Oscillating and contact modes, applications : polymers, biology…

EZ Liquids

The Nano-Observer AFM is compatible with imaging in liquid environment with the accessory EZ liquids.

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