Environmental control

AFM environmental control

The Nano-Observer AFM is compatible with a controlled environment during the image aquisition. With the Atmosphere control accessory, it is possible to isolate the volume inside the AFM, introduce an inert gas or control the relative humidity. Setting the relative humidity to values close to 0% inside the chamber is vital to have reproducible results when using electrical modes such as HD-KFM, ResiScope, SMIM, EFM,.. in order to avoid effects of local oxidation due to the presence of water layers on the surface. In the case of experiments of local-probe anodic oxidation, it is required to have a precise and reproducible control of the relative humidity (RH) during the study of oxidation kinetics. The small volume of the atmosphere control accessory, together with the diffusors in the gas inlet of the Nano-Observer AFM, allow a fast and rapid control of the changes in RH.

HD-KFM on HOPG, Humidity Control (70%), effect over the time, 30μm scan

Nano-Observer AFM in Glovebox

Exploring the properties of many materials requires working in a controlled environment to protect the samples from environmental influences (2D, organic or photovoltaic materials).

The Nano-Observer AFM perfectly matches to this type of request:

Small AFM allowing easy integration into a glove box or passage through the airlock.
Probe mounting outside of the glove box
No cables or connectors to manipulate (everything is controlled by software)
No contamination of samples

Nano-Observer AFM in Glovebox 2
Nano-Observer AFM in Glovebox

The installation presented in this glove box consists of the Nano-Observer AFM, an anti-vibration table and an acoustic isolation box.

This implementation considerably reduces external interference, sample contamination and improves the accuracy of the results.



Prevent contamination & stable measurements

The Nano-Observer is designed to offer environmental control (gas, humidity…) to improve your electrical measurements or protect your sample from oxidation.


 Prevents the contamination
 Stable measurement for electrical characterization
 Atmosphere volume : 451 cm3


Electrical measurements :ResiScope, CAFM, HD-KFM
 Humidity control
 Probe-induced local oxidation.

Other AFM environments

EZ liquids

Measurements in liquid


EZ Temp

Temperature control


Related products

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ResiScope II,
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