Environmental control

Overview

AFM environmental control

The Nano-Observer AFM is compatible with a controlled environment during the image aquisition. With the Atmosphere control accessory, it is possible to isolate the volume inside the AFM, introduce an inert gas or control the relative humidity. Setting the relative humidity to values close to 0% inside the chamber is vital to have reproducible results when using electrical modes such as HD-KFM, ResiScope, SMIM, EFM,.. in order to avoid effects of local oxidation due to the presence of water layers on the surface. In the case of experiments of local-probe anodic oxidation, it is required to have a precise and reproducible control of the relative humidity (RH) during the study of oxidation kinetics. The small volume of the atmosphere control accessory, together with the diffusors in the gas inlet of the Nano-Observer AFM, allow a fast and rapid control of the changes in RH.

HD-KFM on HOPG, Humidity Control (70%), effect over the time, 30μm scan

Applications

 Electrical measurements : ResiScope, CAFM, HD-KFM
 Humidity control
 Probe-induced local oxidation.

Interest

Prevent contamination & stable measurements

The Nano-Observer is designed to offer environmental control (gas, humidity…) to improve your electrical measurements or protect your sample from oxidation.

Benefits

 Prevents the contamination
 Stable measurement for electrical characterization
 Atmosphere volume : 451 cm3

Other AFM environments

EZ liquids

Measurements in liquid

EZ Temp

Temperature control

Related products

AFM microscope Nano Observer

ResiScope II,
AFM Electrical Characterization

AFM Probes Shop,
Wide range of SPM probes

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