ResiScope II & Soft ResiScope
The World’s Greatest Performance for AFM Electrical Characterization
The World’s Greatest Performance for AFM Electrical Characterization
The ResiScope II is a unique system able to measure AFM resistance over 10 decades with a high sensitivity and resolution.
The Soft ResiScope mode is able to expand the fields of applications of the « ResiScope II » to soft samples (organic solar cells, conducting polymers or other biological samples).
The most advanced single-pass KFM mode
HD-KFM developed by CSI for the Nano-Observer AFM has the advantage of amplifying the feedback signal through the second eigenmode of the cantilever. Also it allows a much closer probe of the electric field created by the surface potential compared to other approaches.
Conductivity, Permittivity & N-Doping Concentration
This new AFM mode, developed by PrimeNano, measures the electrical properties of materials at length scales from 10’s of nanometers to microns. sMIM modules produce high quality images of local electrical properties with better than 50 nm resolution.
Nano-Observer AFM microscope,
The best AFM
All AFM modes,
Standard & Advanced modes
Environments,
Gas, Humidity, liquids, temperature.