Advanced AFM Electrical Modes

ResiScope II & Soft ResiScope

The World’s Greatest Performance for AFM Electrical Characterization

The ResiScope II is a unique system able to measure AFM resistance over 10 decades with a high sensitivity and resolution.

The Soft ResiScope mode is able to expand the fields of applications of the « ResiScope II » to soft samples (organic solar cells, conducting polymers or other biological samples).

Resistance measurement
Current measurement (& IV spectroscopy)

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Resistance 10² ohms to 10¹² ohms (10 decades dynamic)
Output information : R, Log R, Current & I/V Spectroscopy

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HD-KFM mode

The most advanced single-pass KFM mode

HD-KFM developed by CSI for the Nano-Observer AFM has the advantage of amplifying the feedback signal through the second eigenmode of the cantilever. Also it allows a much closer probe of the electric field created by the surface potential compared to other approaches.

Surface potential mapping
2nd lock-in amplifier
NO LIFT : Very high sensitivity & higher spatial resolution

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MoS2 flakes on Si, HD-KFM, 30µm

Scanning Microwave Impedance Microscopy

Conductivity, Permittivity & N-Doping Concentration

This new AFM mode, developed by PrimeNano, measures the electrical properties of materials at length scales from 10’s of nanometers to microns. sMIM modules produce high quality images of local electrical properties with better than 50 nm resolution.

Unprecedented Sensitivity
Single scan – 6 channels of data
Subsurface Imaging