ResiScope II & Soft ResiScope
The World’s Greatest Performance for AFM Electrical Characterization
Advanced AFM Electrical Modes
The ResiScope II is a unique system able to measure AFM resistance over 10 decades with a high sensitivity and resolution.
The Soft ResiScope mode is able to expand the fields of applications of the « ResiScope II » to soft samples (organic solar cells, conducting polymers or other biological samples).
Resistance measurement
Current measurement (& IV spectroscopy)
Resistance 102 ohms to 1012 ohms (10 decades dynamic)
Output information : R, Log R, Current & I/V Spectroscopy
HD-KFM mode
The most advanced single-pass KFM mode
HD-KFM developed by CSI for the Nano-Observer AFM has the advantage of amplifying the feedback signal through the second eigenmode of the cantilever. Also it allows a much closer probe of the electric field created by the surface potential compared to other approaches.
Surface potential mapping
2nd lock-in amplifier
NO LIFT : Very high sensitivity & higher spatial resolution
Scanning Microwave Impedance Microscopy
Conductivity, Permittivity & N-Doping Concentration
This new AFM mode, developed by PrimeNano, measures the electrical properties of materials at length scales from 10’s of nanometers to microns. sMIM modules produce high quality images of local electrical properties with better than 50 nm resolution.
Unprecedented Sensitivity
Single scan – 6 channels of data
Subsurface Imaging
Minimal Sample Prep Time
No Conductive Path Needed
Simultaneously
Related products
Nano-Observer AFM microscope,
The best AFM
All AFM modes,
Standard & Advanced modes
Environments,
Gas, Humidity, liquids, temperature.