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Archives des ResiScope/ Conductive/ PFM modes probes - csinstruments

ResiScope/ Conductive/ PFM modes probes

ResiScope/ Conductive/ PFM modes are based on contact mode. A good electrical contact is necessary to do an conductive measurement.
Use highest spring constant as possible without damaging the sample.
– Diamond probes are dedicated for hard material.
– Low ROC (radius of curvature) diamond probes are used for high resolution
– Metal coating are dedicated for soft material

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