Piezoresponse Force Microscopy Mode

Overview

Piezoresponse Force Microscopy mode

Piezoresponse Force Microscopy mode (PFM) is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.

Applications

 Material Science

Interest

Mapping piezoelectric field

Piezoresponsive materials are substances that undergo mechanical deformation in response to an applied voltage. Piezoresponse Force Microscopy (PFM) enables high-resolution nanoscale characterization of this piezoresponsive materials.

Benefits

 high sensitivity of the phase signals and amplitide
 Mapping piezoelectric field

PZT, PFM mode, 10µm
ZnO, PFM mode, 1µm
Recommended AFM probes

Piezoresponse Force Microscopy mode probes

Diamond Probes

High Resolution

Metal Coating

Related products

AFM microscope Nano Observer

ResiScope II,
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