Magnetic Lateral Field Microscopy

Magnetic Lateral Force Microscopy (MLFM) is the most advanced mode for magnetic characterization in Atomic Force Microscopy. It combines Magnetic Force Microscopy (MFM) mode with an external in-plane magnetic generator so that dynamic characterization like displacement of domain walls or rotation of magnetization reversal can be mapped. The external magnetic field generator is based on two unbalanced magnetic rods that are rotated with an stepper motor, so that there is no induced heating by current flowing as in magnetic coild field setup.

Applications

 Data storage  Material science  Semiconductor