Magnetic Force Microscopy Mode

Magnetic Force Microscopy Mode

Magnetic Force Microscopy Mode (MFM) is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.

Applications

 Semiconductor
 Data storage
 Material science

Interests

Magnetic domains mapping

Magnetic Force Microscopy is an AFM mode that maps the magnetic force gradient on the sample surface. MFM can be used to image both naturally occurring or written domain structures in magnetic materials.

Benefits

 Study of magnetic materials
 Mapping of magnetic field
 High sensitivity of the phase signals and amplitude

Magnetic Force Microscopy mode probes

Related products

ResiScope II,
AFM Electrical Characterization

AFM Probes Shop,
Wide range of SPM probes

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