Magnetic Force Microscopy Mode

Magnetic Force Microscopy Mode

Magnetic Force Microscopy Mode (MFM) is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.

Applications

 Semiconductor
 Data storage
 Material science

Related products

AFM microscope Nano Observer

ResiScope II,
AFM Electrical Characterization

AFM Probes Shop,
Wide range of SPM probes

Menu