Magnetic Force Microscopy mode probes

MAGT probes are dedicated for standard MFM measurements.
MAGT-LM & MAGT-HM probes are usefull for specific measurements.

MFM is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.

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