HD-KFM mode
Graphene
8µm

ResiScope mode
Dopant profiling on clived Si
2µm

Soft IC mode
PS-PMMA
50µm

High-definition AFM imagery finally accessible to everyone in a few seconds

User-Friendly Interface

The NanoSolution user interface is very intuitive and versatile;
AFM mode selection quickly and automatically configures the electronics in just one click requiring no help • from the user
The interface, composed of clickable buttons and a guided workflow allows easy configuration of the AFM for • efficient image acquisition
The top view allows for simple laser alignment and adjustment by displaying a view of the laser reflection on • the tip. The side view allows a really easy pre-approach without damage to the tip and sample.
The auto setting allows the user to obtain an AFM image in just a few clicks while access to the parameters • gives an expert the opportunity to exercise all of the AFM’s capabilities for a very high quality image.

Software Designed for Everyone: Performance and Versatility

Whether the user is new or experienced, whether AFM needs are focused on academic research or industry, NanoSolution is a software suitable for everyone.
The ultra fast automated mode allows inexperienced users to produce a quality image very easily and with less support. All the user needs to do is to follow the workflow instructions for configuring the AFM and launch the scan in 1 click.
Auto tune
Auto approach
Auto gain
Auto predefined setpoint AFM condition

In parallel, the manual mode which requires advanced experimentation and requires increased knowledge in the acquisition of an image, offers high control and gives access to all the functions and adjustments necessary so that the most experienced users can refine their results and generate high quality images usable for their analyzes.

Advanced spectroscopy

In addition to the standard spectroscopy parameters, the Nanosolution software has unique functions specially created for force curve spectroscopy.
The FLEX GRID allows the user to select several points to obtain during the scan and the force curves at the • coordinates selected. An interactive file will then allow him to positioned curve on topography (or other signal).
The FIXED STEP GRID allows the user to obtain a force curve mapping configured in number of points per line.•
The EXPERT CURVE CONTROL is segment programming of the displacement of the probe in Z with different • parameters: speed, resolution or even duration.

These unique functions make NanoSolution a powerful software for force curves.

Related products

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The World’s Greatest Performance for AFM Electrical Characterization

AFM Probes Shop,
Wide range of SPM probes compatible with most commercially avaible SPMs.