Electric Force Microscopy Mode

Electric Force Microscopy Mode

Electric Force Microscopy Mode (EFM) is an oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface.

Applications

 Material science
 Electronic material
 Life science
 Polymer science
 Nanostructure

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