High Resolution Diamond Probes

Highly conductive diamond probes, formed by a unique patented process ensure the best possible wear and electrical performance. These tips are sharper and last longer than any other electrical AFM probe.

– CS-A-E2.8 : Description R, G; Constant (N/m) 1.2, 2.8, 4.5; Frequency (khz) 50, 65, 100; Tip ROC < 10 nm

Showing the single result