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CS-A-E2.8

770,006485,00

Highly conductive diamond probes, formed by a unique patented process ensure the best possible wear and electrical performance.

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Description

Highly conductive diamond probes, formed by a unique patented process ensure the best possible wear and electrical performance. These tips are sharper and last longer than any other electrical AFM probe.

Bulk Tip 
Tip Shape4 Sided Pyramid
Height12.5 ± 2.5 um
Front Angle (FA)25 ± 5 degrees
Back Angle (SA)15 ± 5 degrees
Side Angle (SA)22.5 ± 5 degrees
Tip Setback (TSB)15 ± 5 um

 

Diamond Tip 
Tip ShapeCone
Radius10 ± 5 nm (AS) / < 5 nm (SS)
Height300 ± 100 nm
Tilt Angle0 ± 1 degrees
MaterialSingle Crystal Diamond
½ Angle15 ± 2 degrees

 

Cantilever Specifications     
Length ± 10 µmWidth ± 5 µmThickness ± 0.5 µmFrequency (kHz)Spring Constant (N/m)Tip Radius (nm)
225351.5652.810

 

Additional information

QUANTITIES PRICE

5, 10, 20, 50

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