Piezoresponse Force Microscopy Mode


PFM principle

PFM principle

PFM is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal



  • Piezoelectric domains mapping
  • Measuring amplitude and phase signals


  • Material science
PFM images

PZT sample, topography and phase signals, scan size 10┬Ám