ACCESS-C

370,00

ACCESS-C probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

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Description

Tip Specifications 
MaterialSi
Height (μm)14-16
CoatingNone
Tip ROC<10nm

 

Cantilever Specifications    
Spring Constant
(N/m)
Frequency
(kHZ)
Length
(μm)
Width
(μm)
Thickness
(μm)
0.31645049.52.5

Additional information

QUANTITIES PRICE

10, 20, 50

BACKSIDE COATING

None, Aluminium

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