Description
| Tip Specifications | |
|---|---|
| Material | Si |
| Height (μm) | 14-16 |
| Coating | None |
| Tip ROC | <10nm |
| Cantilever Specifications | ||||
|---|---|---|---|---|
| Spring Constant (N/m) | Frequency (kHZ) | Length (μm) | Width (μm) | Thickness (μm) |
| 0.3 | 16 | 450 | 49.5 | 2.5 |
ACCESS-C
ACCESS-C probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.
Additional information
| QUANTITIES PRICE | 10, 20, 50 |
|---|---|
| BACKSIDE COATING | None, Aluminium |
