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sMIM Applications

This AFM mode measures the electrical properties of materials at length scales from 10’s of nanometers to microns. sMIM modules produce high quality images of local electrical properties with better than 50 nm resolution.The core of our technical approach is to utilize microwave reflections from a nm scale region of the sample directly under the sMIM probe.


 Doping profiles
 Green Energy
 Photonic materials and devices

sRAM, topography & dC/dV signals, sMIM mode, 13µm

Related products

sMIM product,
AFM Electrical measurements

AFM microscope Nano Observer

AFM Probes Shop,
Wide range of SPM probes.