Nano-Observer AFM microscope

Your Research Atomic Force Microscope

AFM Microscope Trade-In

 

 

 

Nano-Observer AFM

Best cost effective solution ! Flexible and powerful

The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode…).

A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all Atomic Force Microscope settings to allow quick and safe AFM acquisitions.

 

puce-jauneHD-KFMTM puce-jauneRESISCOPETM puce-jauneSoft ResiScope puce-jauneEZ Temp puce-jauneEZ Liquids puce-jauneEnvironmental control puce-jauneQuality measurementspuce-jauneEasy of use puce-jauneMultiple modes

Compact and robust, the Nano-Observer Atomic Force Microscope fulfills the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy. Easy positioning can be done by combining the optical access with the X-Y translation stage.

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Multiple Modes

Environments

 Affordable Atomic Force Microscope
at Your Fingertips
 

 

KFM single pass
HD-KFMTM
FMM mode Force
modulation
 temperature controlEZ Temp
(video>>)
ResiScope mode
RESISCOP
ETM
Thermal analysis Thermal
analysis
liquid measurement
EZ Liquids
Soft ResiScope ModeSoft
ResiScope
contact modeContact/
Friction
Atmosphere controlEnvironmental control (video>>)
MFM mode
MFM
Oscillating mode Oscillating
mode/Phase
EFm mode
EFM
CAFM mode
Conductive AFM
……………………………………………………………………………………….
……………………………….. ……………………………………..

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Applications

  • Material characterization
  • Polymer science
  • Electrical characterization
  • Semiconductor
  • Soft sample
  • Biology

………………………………………..

See Gallery……………………………………………………
PCL crystallization
Polymer crystallization
under temperature contro
l

Specific Electrical Modes (HD KFM, ResiScope & Soft ResiScope)

KFM single pass

HD-KFMTM (Kelvin Force Microscopy)


  • Surface potential mapping
  • 2nd lock-in amplifier
  • NO LIFT : Very high sensitivity & higher spatial resolution

 

 

 

 

 

 

HD KFM Mode

Single-pass vs dual-pass KFM

Single-pass vs dual-pass KFM


ResiScope mode

ResiScopeTM II (Resistance over 10 decades)

 

  • Resistance & Current mapping
  • High sensitivity over the full range
  • Compatible with
    • Oscillating mode / AC mode
    • EFM / MFM or single pass KFM
  • Out put information
    • R
    • Log R
    • CurrentI/V spectroscopy

ResiScope Mode…………………………………………………………

ResiScope II

Resistance image, Scan size 5 μm x 5 μm, Local Oxidation Nanolithography (LON) patterns, obtained on a 10 nm thick titanium layer deposited onto alumina substrate. Courtesy of Angel Perez. Institute of Materials Science of Barcelona (ICMAB – CSIC) Resistance signal,Contact mode, Scan size: 50×50 microns. RAM memory aaaaaaaaaaaaaaaaaaaaaaa Resistance signal, scan size 5µm, Organic Solar Cell aaaaaaaaaaaaaaaaaaaaaaaaaaa

 


 

Soft ResiScope Mode

Soft ResiScope (True Quantitative Resistance/ Current Measurements with Intermittent Contact)

 

Soft ResiScope Principle Soft ResiScope principle
  • UNIQUE Technology
  • NO Contact Mode
  • NO Friction
  • Constant Force = Quantitative Electrical Measurements

 

 

 

Soft ResiScope Mode

 


Quality measurements

Low noise laser and electronics to achieve high resolution

 

  • No interference
  • Pure deflection signal
  • Better resolution (imaging and force curves)

Quality measurements

Spectroscopy

Structure of the Flexstage (patented)

  • Patented amplified flexure stage and noise reduction
  • 3 independent axis
  • atomic steps or molecular resolution until 100µm scan
    • scan resolution 0.06nm X-Y – 0.006nm in Z
  • Low Noise Laser + 24 bit scan control + Low noise controller+ flexstage = all low noise loop = Large scan to high resolution without any scanner replacement.
Flestage

Resolution / sharpness

 

High resolution

Topography signal, Scan size 3µm x 3µm, Graphene Topography signal, Scan range 5µm x 5µm, Mono atomic steps on SrTiO3 film Topography signal, Scan range 150nm x 150nm, C36 molecules deposited on HOPG

Left Topography, 3μm x 3μm, Middle : Phase signal: 3μm x3μm, Right: phase signal : 1μm x 1μm, Nano-Donuts Fluoroalkanes F14H20 on Si


 

Integrated lock-in = Sensitive Phase contrast

 

Topography and phase signals, Polymers (PDES) – 12µm scan Topography and phase signals Graphene sample 10µm scan

 


Environments

 

Atmosphere control

Environmental control

 

  • Prevents the contamination, sample oxydation…
  • Stable measurement for electrical characterization
    • ResiScope, CAFM, KFM
  • Gases, humidity…
  • Applications
    • Electrical measurement

Environmental control


See Video

Atmosphere control
Environmental control

temperature control

EZ Temp

Precise temperature & imaging during temperature changes (Ambiant to 200°C)

PCL crystallization

Temperature : 70°C to 40°C, Resonant mode, PCL (polycaprolactone) crystallization under temperature control , Scan size : 20µm

EZ Temp


 

liquid measurement

EZ Liquids

Topography signal, scan size 80µm x 80µm Embryonic Fibroblast cell DNA circles deposited on mica
EZ liquids

Multiple modes

 

EFm mode Electric Field Microscopy (EFM)

A very accurate lock-in for optimized phase measurements

Top Topography, 65μm x 65μm, Bottom : Phase signal: 65μm x65μm, Right: phase signal : 15μm x 15μm, Nanotubes «network» deposited between two electrodes (positive and negative bias).

Topography and EFM signals on gold Electrodes, 60µm scan……………………………………………………..

 

EFM Mode

MFM mode Magnetic Field Microscopy (MFM)

A very accurate lock-in for optimized phase measurements

Artificial Spin Ice 6.5µm scan Sample courtesy of P. Vavassori, Nanogune – SPAIN ………………………………….

Topography and MFM signals Scan range 4.5µm x 4.5µm Magnetic triangles structures

 

MFM Mode

 

CAFM mode Conductive AFM

Current signal Scan range 35µm x 35µm, Semiconductor. ……………………………………… Current signal Scan size : 3µm x 3µm, ITO ………………………………………..
Conductive AFM Mode

FMM mode Force modulation

Topography and Phase signals, Scan size 25µm x 25 µm, Block Polymer

Force Modulation Mode


PFM mode Piezo Force Microscope (PFM)

 

Topography and Amplitude signals, scan size 2.5µm*2.5µm, ZnO

PFM Mode


Ease of use

Top view for tip/sample positioning

A video color camera is provided with the AFM microscope offering an helpful viewing from the top for tip/sample positioning or side view to make the tip/sample approach easier.


 

Side View

  • Sample/tip visibility
  • Ease of use
  • Avoids damaging sample or tip
  • Better contrast by lateral illumination….

 


 

High performance optic (option)

A high performance optic (option) is also available to localize small features on your sample.

High resolution video on 10µm grid AFM probe alignemed to a functionalized probe using HD camera

 


 

Intuitive software

Only main parameters are displayed for a clean and simple interface software

  • AFM Mode choice in one click
  • Autoset of the controller ! (no cables or module to mount or remove)
  • Pre-configured software (auto settings of most of the parameters)
  • Atomic Force Microscope adjustment by “Steps” : the user can follow defined “steps” to set easily the AFM.


Specifications

XY Scan range100µm (tolerance +/- 10%)
Z range9µm ( tolerance +/- 10%)
XY drive resolution24 bit control - 0.06 Angströms
Z drive resolution24 bit control – 0.006 Angströms
Z noise level<0.05nm RMS
Reduced coherence laserWavelenght 658 nm – power < 1mW
Color optical view systemTop and side view
6 DAC Outputs6 D/A Converters – 24 bit
8 ADC Inputs8 A/D Converters – 16 bit
Data pointsUp to 4096
Integrated Lock-in (Oscillating mode & phase)Up to 6 MHz
InterfaceUSB 2.0
Controller size - weight8 cm x 20 cm x 26 cm - 2 kg
PowerAC 100 – 240 V 47-63 Hz
Operating SystemWindows XP (SP3 & Framework.NET 3.5 SP1) or Windows 7 or 8

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