Electric Force Microscopy Mode

EFM mode principle

EFM mode principle


EFM is an oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface



  • Electrical characterization
  • Mapping of gradient electric field



  • Semiconductors
  • Materials science

    EFM images

    Nanotubes « network » deposited between two electrode (positive and negativ bias), scan sizes : left 65µm, right 15µm









More AFM modes