AFM environmental control
Prevent contamination & stable measurements
Prevent contamination & stable measurements
The Nano-Observer AFM is compatible with a controlled environment during the image aquisition. With the Atmosphere control accessory, it is possible to isolate the volume inside the AFM, introduce an inert gas or control the relative humidity.
Prevents the contamination
Stable measurement for electrical characterization
Atmosphere volume : 451 cm3
Laser angle compensation & No additional adjustment
The Nano-Observer AFM is compatible with imaging in liquid environment with the accessory EZ liquids. It includes an specially designed cell and tip holder for imaging in liquids in both contact or resonant modes.
Laser angle compensation.
No additional laser re-positionning.
Long term stability imaging in resonant mode.
From -40°C to 300°C
The Nano-Observer AFM is compatible with the temperature control accessory EZ temperature developed by CSI to deliver precise temperature control and imaging during temperature changes. With this accessory, it is possible to cool the analysis zone to -40°C and heating sample to 300°C
Limited thermal expansion
Thermal insulation
-40°C to 300°C
Compatible with : Oscillating/contact modes, Environmental control, Liquids
Nano-Observer AFM microscope,
The best AFM
ResiScope II,
AFM Electrical Characterization
All AFM modes,
Standard & Advanced modes