Piezoresponse Force Microscopy Applications

PFM is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.

Applications

 Material Science

PZT, PFM mode, 10µm

Related products

AFM microscope Nano Observer

ResiScope II,
AFM Electrical Characterization

AFM Probes Shop,
Wide range of SPM probes.

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