ACCESS-NC

ACCESS-NC probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

For more informations, please contact us

Description

Tip Specifications 
MaterialSi
Height (μm)14-16
CoatingNone
Tip ROC<10nm

 

Cantilever Specifications    
Spring Constant
(N/m)
Frequency
(kHZ)
Length
(μm)
Width
(μm)
Thickness
(μm)
78300150545.2

Additional information

QUANTITIES PRICE

10, 20, 50

BACKSIDE COATING

None, Aluminium

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