FORT-SS

590,002350,00

Super-Sharp silicon probes designed for Non-Contact, Tapping Mode, Intermittent Contact, and/or Close Contact applications. Our Super Sharp probes yield enhanced resolution images.

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Description

FORTA probes are silicon probes with low spring constant for soft tapping measurements (low force). These probes have a low frequency that allows for soft samples and liquid measurements.

Tip Specifications 
MaterialSi
ShapePyramidal
Height (μm)14-16
Tip ROC1 - 2 nm

 

Cantilever Specifications    
Spring Constant
(N/m)
Frequency
(kHZ)
Length
(μm)
Width
(μm)
Thickness
(μm)
1.661225272.7

Additional information

QUANTITIES PRICE

10, 20, 50

BACKSIDE COATING

None, Aluminium

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