ACL-SS

Super-Sharp silicon probes designed for Non-Contact, Tapping Mode, Intermittent Contact, and/or Close Contact applications. Our Super Sharp probes yield enhanced resolution images.

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Description

ACL probes are silicon probes with high spring constant for hard tapping measurements (high force). These probes have a medium frequency that allows differents capabilities in phase imaging
Tip Specifications
MaterialSi
ShapePyramidal
Height (μm)14-16
Tip ROC1 - 2 nm

 

Cantilever Specifications
Spring Constant (N/m)Frequency (kHZ)Length (μm)Width (μm)Thickness (μm)
58190225407.8

Additional information

QUANTITIES PRICE

10, 20, 50

BACKSIDE COATING

None, Aluminium

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