ACT-SS

590,002350,00

Super-Sharp silicon probes designed for Non-Contact, Tapping Mode, Intermittent Contact, and/or Close Contact applications. Our Super Sharp probes yield enhanced resolution images.

Clear
SKU: N/A Category:

Description

ACT probes are silicon probes with high spring constant for hard tapping measurements (high force). These probes have a high frequency that allows for faster scanning speeds.

Tip Specifications 
MaterialSi
ShapePyramidal
Height (μm)14-16
Tip ROC1 - 2 nm
Cantilever Specifications    
Spring Constant (N/m)Frequency (kHZ)Length (μm)Width (μm)Thickness (μm)
37300125304.0

Additional information

QUANTITIES PRICE

10, 20, 50

BACKSIDE COATING

None, Aluminium

Menu