Description
ACT probes are silicon probes with high spring constant for hard tapping measurements (high force). These probes have a high frequency that allows for faster scanning speeds.
| Tip Specifications | |
|---|---|
| Material | Si |
| Shape | Pyramidal |
| Height (μm) | 14-16 |
| Tip ROC | 6 nm (Guaranteed <10 nm) |
| Cantilever Specifications | ||||
|---|---|---|---|---|
| Spring Constant (N/m) | Frequency (kHZ) | Length (μm) | Width (μm) | Thickness (μm) |
| 37 | 300 | 125 | 30 | 4.0 |
