Description
TM300 probes have sharp silicon tip on a short silicon cantilever for fast imaging in Tapping/Non-contact modes.
| Tip Specifications | |
|---|---|
| Material | Si |
| Shape | Pyramidal |
| Height (μm) | 14-16 |
| Tip ROC | <10 nm |
| Cantilever Specifications | ||||
|---|---|---|---|---|
| Spring Constant (N/m) | Frequency (kHZ) | Length (μm) | Width (μm) | Thickness (μm) |
| 40 | 300 | 125 | 30 | 4 |
